3-D technology to be tested for carry-on bags at JFK Airport
Thursday, 19 July 2018 NEW YORK (AP) — Travelers at John F. Kennedy Airport in New York will soon experience a test of more advanced, three-dimensional imaging to screen carry-on bags. The Transportation Security Administration and American Airlines said Thursday that a test of computed-tomography scanners will start later this month at JFK's Terminal 8. The machines let screeners manipulate 3-D images to get a better idea of what's inside a bag. TSA has been running similar tests in Phoenix and Boston since last year. TSA uses 3-D imaging to scan checked bags, but until recently the scanners have been too large and heavy for use at security checkpoints. Instead, screeners use older X-ray technology to inspect carry-on bags.
More and more communities around the country are banning plastic bags because of environmental concerns. Both Washtenaw and Muskegon counties have talked about it, but the state is looking to stop them..