Powerful AFM Offline Analysis Software Now Available for Oxford Instruments Asylum Research Jupiter XR Large-Sample Atomic Force Microscope

SANTA BARBARA, Calif.--(BUSINESS WIRE)-- #atomicforcemicroscopy--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force microscope (AFM). AR Maps provides roughness information based on ISO standards, generates statistics reports, conducts critical dimension and trench analysis, performs particle analysis, and much more. The new AR Maps software package will ship with all new Jupiter XR AFM systems and will be availabl